LCPME - UMR 7564


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Home page > Facilities > Spectrocopies and Microscopies of Interfaces > Tools and techniques

Tools and techniques


Atomic Force Microscopy (AFM)

Local Contact : Grégory Francius, Researcher & Sofiane El Kirat Chatel, Researcher

Equipments :

    AFM Asylum (Oxford instruments) : MFP3D-Bio
    Closed fluid cell
    Environmental controller

    Optic Inverted Microscope Olympus IX71
    3 objectives LUCPlanFL N (x4, x20 and x60)
    Laser Olympus TH4-200
    Cantilevers Bruker modèles : MSCT-AUNM, RTESP7 


AFM Bruker Bioscope Resolve mounted on a Leica DMi8 inverted optical microscope.
Analysis of samples (organic, inorganic, cells, ...) in air, in organic solvent (hexane, isopropanol, octadecene, octylether etc) or in liquid with temperature control.
    - Imaging/Topography of surfaces (resolution: nm).
    - Force spectroscopy (resolution: pN) and mapping of mechanical and adhesive properties (single-molecule and single-cell force spectroscopy).
    - PFT-QNM (peak force tapping - quantitative nanomechanical mapping): simultaneous mapping of mechanical properties and topography.
    Correlative analysis:
    - Inverted microscope DMi8 Leica for optical and fluorescence analysis (Obj. 20x, 40x, 63x).
    - Raman micro-spectroscopy (on-going)

Electrochemical Microscopy (SECM)

Local Contact : Mathieu ETIENNE, Researcher & Michel PERDICAKIS, Research Engineer
Equipments :

    Electrodes : platinum (25 µm-100 nm), gold (25 µm), carbon (7 µm), pH electrode based on iridium oxide, potentiometric electrodes based on liquid membranes.
    Positioning of the electrode : motors
    (25 mm, resolution of 1 µm) and piezoélectric elements (100 µm, resolution of 1 nm)
    Electrochemical measurements : potentiostats or bipotentiostats PalmSens, Bio-logic and Metrohm-Autolab) or potentiometric (e.g. for pH evaluation ; Keithley high impedance potentiometer).
    Electrode position monitoring by electrochemistry and detection of shear forces.

  microscopie électrochimique


Vibrational Spectroscopies

Local contact : Cédric Carteret, Professor - Manuel Dossot, Lecturer - Jérôme Grausem, Engineer
Equipments :

  • Jobin Yvon T64000 high resolution confocal Raman microscope (488 nm, 457 nm, 514 nm, 632 nm, 532 nm, 561nm, 672 nm)
  • Thermo Nicolet 8700 FTIR - near/middle/far infrared 
  • Brucker Vertex 70V - middle and far infrared
  • Brucker Tensor 27 - middle infrared
  • Brucker Hyperion infrared microscope for middle infrared chemical mapping in reflection / transmission or with ATR objective
  • Infrared accessories for transmission, diamond / germanium / ZnSe ATR, DRIFT, IRRAS
  • Various accessories for Raman and FTIR analysis for temperature controlled (from 93 to 1073K) and/or atmosphere controlled (vacuum, N2 , relative humidity . . .) experiments

X-Ray Photoelectron Spectroscopy - XPS
Local Contact : Martine Mallet, Lecturer & Aurélien Renard, Engineer
Equipments :
KRATOS : AXIS Ultra DLD (Delay Line Detector)
Hemispherical analyser 180 degree, 165 mm mean radius
- UPS : radiation source by He UV lamp  : HeI : (21.2 eV) & HeII: (40.8 eV) Resolution at the Fermi level (Ag) : 0,12 eV - Charge neutralizer - Ionic sputtering - Low and high temperature control 
- XPS : Monochromatic Al-Kalpha source : 1486.6 eV Spectral resolution FWHM 0,45 eV - Charge neutralizer - Ionic sputtering - Low and High temperatures control - Parallel Imaging - Angle resolved XPS
XPS Kratos

Nuclear Spectrometry (57Fe Mössbauer spectroscopy)
Local Contact : Mustapha Abdelmoula, Research Engineer
Equipments :
Backscattering : CEMS, XMS, Gamma MS (MIMOS at room temperature and in situ)
2 Transmission Mössbauer Spectrometers at low temperature
Cryostat Cryo Industries of America (2 to 300 K)
Cold head - Janis - (2 to 300 K, Gifford Mac-Mahon cycle)
3 radioactives sources 50 mCi of 57Co